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Double pulse testing is a method used to evaluate the performance and behaviour of electronic devices, especially in power electronics, under two consecutive electrical pulses. The technique is commonly used in testing components like semiconductor devices, circuits, and systems to assess their response to rapid changes in voltages or current.

The TGP3100 Series true pulse generators offer enormous versatility in generating the double pulse waveform required for this testing.  This application note covers details of its utilization.